ATE Interface Products

ATE Interface Products
	XZIF Interconnect Xandex is "Changing The Direction of Test Interfacing" with the Xandex Zero Insertion Force Interconnect

	ATE Transmission Line Solutions High performance digital, analog, RF and power/utility coaxial cable assemblies, components, and probe modules for ATE interfacing.

	Vacuum Interfacing Xandex Vacuum interface technology enables unprecedented repeatability and parallelism in wafer probe.

	Prober-Tester Interfaces Superior electrical and mechanical characteristics designed for a variety of tester platforms.

	Docking Systems Precision test head alignment.

	Probe Card/Load Board Assembly Swappable load board, interface and probe card in an ultra-thin package.

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Congratulations to Roger Sinsheimer, P.E, Xandex Chief Engineer and Ken Karklin, Agilent Technologies R&D Project Manager for receiving the Best Presentation Award at SouthWest Test Workshop 2001!! View the Award Winning Presentation Here (PDF 6.4Mb) (Adobe Acrobat® Reader Required)

A Better Tester-Prober Interface Paradigm: Direct Docking View the presentation by Roger Sinsheimer, P.E., Xandex Sr. Staff Engineer (PDF 11.4Mb) as presented at the Fusion User's Conference Feb. 07, 2001, New Orleans, LA email comments on this presentation to Roger Sinsheimer by clicking HERE. (Adobe Acrobat® Reader Required)