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Automated Test Equipment (ATE) Interface Products

 

XZIF Interconnect
Xandex is "Changing The Direction of Test Interfacing" with the Xandex Zero Insertion Force Interconnect
 
ATE Transmission Line Solutions
High performance digital, analog, RF and power/utility coaxial cable assemblies, components, and  probe modules for ATE interfacing.
 
Vacuum Interfacing
Xandex Vacuum interface technology enables unprecedented repeatability and parallelism in wafer probe.
 
Prober-Tester Interfaces
Superior electrical and mechanical characteristics designed for a variety of tester platforms.
 
docking Docking Systems
Precision test head alignment. 
 
pclbasmall Probe Card/Load Board Assembly
Swappable load board, interface and probe card in an ultra-thin package.
 
 

 

Congratulations to Roger Sinsheimer, P.E, Xandex Chief Engineer and Ken Karklin, Agilent Technologies R&D Project Manager for receiving the Best Presentation Award at SouthWest Test Workshop 2001!!
View the Award Winning Presentation Here
(PDF 6.4Mb)

(Adobe Acrobat® Reader Required)
 
A Better Tester-Prober Interface Paradigm: Direct Docking 
View the presentation by Roger Sinsheimer, P.E., Xandex Sr. Staff Engineer
(PDF 11.4Mb)
as presented at the Fusion User's Conference Feb. 07, 2001, New Orleans, LA 

email comments on this presentation to Roger Sinsheimer by clicking HERE.
(Adobe Acrobat® Reader Required)

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